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dc.contributor.advisorAskew, Thomas R., 1955-
dc.contributor.advisorChabal, Yves
dc.contributor.authorSugimoto, Michelle
dc.date.accessioned2017-07-03T16:43:32Z
dc.date.available2017-07-03T16:43:32Z
dc.date.issued2017
dc.identifier.urihttp://hdl.handle.net/10920/31014
dc.descriptioniv, 15 p.en_US
dc.description.abstractPrevious resistivity measurements of ultra-thin ZnO films reveal a change from semiconductive to metallic behavior at low temperatures for the Zn-terminated surface. The present work confirms this change using IR transmittance spectroscopy measured as a function of temperature. Suggested by the crystal structure of ZnO, the results are consistent with a competition between surface stabilization mechanisms. One of the proposed stabilization mechanisms, a partial charge transfer from the O-terminated surface to the Zn-terminated, would result in metallization of the Zn-terminated surface. This would explain the observed metallic behavior, which appears to be the favor mechanism at lower temperatures.en_US
dc.format.mimetypeapplication/pdf
dc.language.isoen_USen_US
dc.relation.ispartofKalamazoo College Physics Senior Individualized Projects Collection
dc.rightsU.S. copyright laws protect this material. Commercial use or distribution of this material is not permitted without prior written permission of the copyright holder. All rights reserved.
dc.titleProbing Surface Conductivity in Ultra-thin ALD ZnO Filmsen_US
dc.typeThesisen_US
KCollege.Access.ContactIf you are not a current Kalamazoo College student, faculty, or staff member, email dspace@kzoo.edu to request access to this thesis.


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  • Physics Senior Individualized Projects [309]
    This collection includes Senior Individualized Projects (SIP's) completed in the Physics Department. Abstracts are generally available to the public, but PDF files are available only to current Kalamazoo College students, faculty, and staff.

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